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Linear & Vertical stages
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Atomic Force Microscope-Crabi-AFM-E-01
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XYZ positioning stage
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Multi-axis stage
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PIEZO POSITIONING STAGE
The OME piezo positioning stage with piezo drives offer high precision positioning in nanometer resolution. The position is measured by an encoder to ensure repeatability and nanometer resolution. Besides, high-precision cross-roller guides are applied for guaranteeing the high guiding accuracy and stiffness.
Specification |
ATOMIC FORCE MICROSCOPE
The atomic force microscope (AFM) is an instrument for resolving surface structure with sub-nano resolution. OME Crabi-AFM is mainly focused on nano-education and fundamental researches. Compact system size and reliable image quality, but affordable price. It must be the best solution with innovation design for you.
Specification |